Peeling Back the Plastic: Finding 0-Days in IoT Devices
- Date:
- Tuesday, November 18
- Time:
- 2 p.m. ET / 7 p.m. GMT
As smart home technology becomes increasingly mainstream, the market has seen a surge in low-cost IoT devices flooding platforms like Amazon. Many of these products are backed by lesser-known manufacturers, often overseas, that prioritize rapid deployment and market share over security and long-term support. This trend has led to a growing number of insecure devices being integrated into home networks, exposing users to significant privacy and security risks.
Speaker: Nick Cerne, Senior Security Consultant
Date/Time: Tuesday, November 18 at 2 p.m. ET / 7 p.m. GMT
What We’ll Cover:
- How to get started in IoT security research and what skills or tools are most valuable
- A walkthrough of prior IoT research that led to the discovery and responsible disclosure of new 0-day vulnerabilities
- Practical testing techniques for identifying critical vulnerabilities in consumer IoT devices
- Step-by-step approaches to analyzing firmware, hardware components, and companion mobile applications
- How device-focused research can uncover hidden API vulnerabilities that typical web assessments often miss
Who Should Attend:
- Security researchers and penetration testers interested in IoT or embedded device testing
- Application and product security engineers expanding into hardware and firmware analysis
- Red teamers and vulnerability researchers looking to broaden their technical scope
- Security leaders seeking to understand emerging IoT risks in consumer and enterprise environments